Parent Category: Rocktabs Archive

RFIC Characterization and Production Test

NI’s RFIC Reference Solution is a hardware and software package for engineers characterizing PAs and Front End Modules. In addition to native support for envelope tracking, DPD, and EVM/ACP measurements, new features include extended DPD capabilities and harmonics measurements up to 26.5 GHz. NI’s Semiconductor Test System now adds features such as 48-port S-parameter measurements and integrated system calibration.

National Instruments
ni.com
IMS Booth # 2431