Smarter mW Design & Test

1705 HFE hotProducts 05

Smarter mW Design & Test

At IMS 2017, visit NI’s booth (#740) to see the latest innovations in smarter microwave design and test, including NI’s newest advancements in test technology for 802.11ax, LTE Advanced Pro and 5G. Demonstrations will include a technology demonstration for 5G RFICS based on NI’s second-generation Vector Signal Transceiver (VST) and specialized software to show generation and analysis of Verizon 5G and New Radio (NR) waveforms. Additional demonstrations include RF amplifier test, MIMO test and more, showcasing the second-generation VST and its instantaneous bandwidth of up to 1GHz for technologies such as 802.11ax, DPD, 5G and radar.

National Instruments
IMS Booth # 740