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Massively Parallel Parametric Test System

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Massively Parallel Parametric Test System

Keysight Technologies announced the third generation of its P9000 series massively parallel parametric test system. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs. For example, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is drastically increasing.

Keysight Technologies
keysight.com

August 2019

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e-Book – Microstrip Antenna Design

A new e-book, authored by industry veteran Kenneth Puglia and featuring NI AWR Design Environment software, explores microstrip antenna design and examines the single-element rectangular microstrip antenna as well as antenna arrays constructed from single microstrip elements. The eBook is available at awr.com/resource-library/ebook-microstrip-antenna-design (registration required).


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Insulated Wire Inc.

Insulated Wire Inc. is pleased to announce that following the retirement of a French delegate, IW Microwave Products Division President, John Morelli, has been appointed as the Secretary for IEC/SC46F, a subcommittee of IEC/TC46. IEC/SC46F is responsible for RF and Microwave Connectors and Components International Standardization.

Mr. Morelli, who is sponsored by Insulated Wire, brings significant RF/Microwave connector and component experience to the position, and we congratulate him on his new appointment. Mr. Morelli had been serving as the chief Technical Advisor for the US National Committee’s Technical Advisory Group to IEC/SC46F.

The US National Committee of the IEC is a fully integrated entity of the American National Standards Institute (ANSI).